Flexible embedded test solution for high-speed analogue front-end architectures - Circuits, Devices and Systems, IEE Proceedings [see also IEE Proceedings G- Circuits, Devices and
نویسنده
چکیده
A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.
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تاریخ انتشار 2008